Searching the RRID Resource Information Network
Are you sure you want to leave this community? Leaving the community will revoke any permissions you have been granted in this community.
Jeol JCM-7000 NeoScope Benchtop Scanning Electron Microscope (SEM) (RRID:SCR_020180)Copy Citation Copied
URL: https://www.jeolusa.com/PRODUCTS/Scanning-Electron-Microscopes-SEM/Benchtop/NeoScope-Benchtop-SEM
Proper Citation: Jeol JCM-7000 NeoScope Benchtop Scanning Electron Microscope (SEM) (RRID:SCR_020180)
Description: Scanning electron microscope that is equipped with large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real time 3D imaging, highly advanced auto functions and option to add fully embedded EDS with real time, Live, analysis.
Resource Type: instrument resource
Keywords: Jeol, JEOL, Scanning Electron Microscope, Instrument Equipment, USEDit,
Expand AllWe found {{ ctrl2.mentions.all_count }} mentions in open access literature.
We have not found any literature mentions for this resource.
We are searching literature mentions for this resource.
Most recent articles:
{{ mention._source.dc.creators[0].familyName }} {{ mention._source.dc.creators[0].initials }}, et al. ({{ mention._source.dc.publicationYear }}) {{ mention._source.dc.title }} {{ mention._source.dc.publishers[0].name }}, {{ mention._source.dc.publishers[0].volume }}({{ mention._source.dc.publishers[0].issue }}), {{ mention._source.dc.publishers[0].pagination }}. (PMID:{{ mention._id.replace('PMID:', '') }})
Check
for all resource mentions.
A list of researchers who have used the resource and an author search tool
A list of researchers who have used the resource and an author search tool. This is available for resources that have literature mentions.
No rating or validation information has been found for Jeol JCM-7000 NeoScope Benchtop Scanning Electron Microscope (SEM).
No alerts have been found for Jeol JCM-7000 NeoScope Benchtop Scanning Electron Microscope (SEM).
Source: SciCrunch Registry
