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https://www.biotek.com/products/software-robotics-robotics/biostack-microplate-stacker/

Microplate stacker compatible with BioTek's washers, dispensers, detectors and imaging systems and accommodates assay workflows for 96- and 384-well plates.

Proper citation: BioTek BioStack Microplate Stacker (RRID:SCR_019734) Copy   

•   Source: SciCrunch Registry

https://www.biotek.com/products/imaging-microscopy-cell-imaging-multi-mode-readers/cytation-1-cell-imaging-multi-mode-reader/

Multi-mode plate reader that combines fluorescence and high contrast brightfield imaging with conventional multi-mode detection.

Proper citation: BioTek Cytation 1 Cell Imaging Multi-Mode Reader (RRID:SCR_019730) Copy   

•   Source: SciCrunch Registry

https://www.biotek.com/products/detection-multi-mode-microplate-readers/cytation-hybrid-multi-mode-reader/

Multi-mode plate reader offers UV-Vis absorbance, fluorescence and luminescence detection detection modes.

Proper citation: BioTek Cytation Hybrid Multi-Mode Microplate Reader (RRID:SCR_019731) Copy   

•   Source: SciCrunch Registry

https://www.biotek.com/products/imaging-microscopy-cell-imaging-multi-mode-readers/cytation-5-cell-imaging-multi-mode-reader/

Multi-mode plate reader that offers up to 60x magnification in fluorescence, brightfield, high contrast brightfield, color brightfield and phase contrast for maximum applications reach. The multi-mode detection modules include filter- and monochromator-based fluorescence detection, luminescence and UV-Vis absorbance detection.

Proper citation: BioTek Cytation 5 Cell Imaging Multi-Mode Reader (RRID:SCR_019732) Copy   

•   Source: SciCrunch Registry

https://covaris.com/products/afa-ultrasonication/ml230/

Focused ultrasonicator that was developed for superior precision and accuracy, new and advanced engineering designs enables easier maintenance and user friendly experience.

Proper citation: Covaris ML230 Focused-Ultrasonicator (RRID:SCR_019819) Copy   

•   Source: SciCrunch Registry

https://www.cressington.com/product_208hr.html

Cressington 208HR now offers real solutions to the problems encountered when coating difficult samples for FE-SEM. In order to minimize the effects of grain size the 208HR offers a full range of coating materials and gives unprecedented control over thickness and deposition conditions. To minimize charging effects the 208HR stage design and wide range of operating pressures allows precise control of the uniformity and conformity of the coating. The HIGH/LOW chamber configuration allows easy adjustment of working distance.

Proper citation: Cressington 208 HR Sputter Coater (RRID:SCR_019824) Copy   

•   Source: SciCrunch Registry

https://www.dell.com/en-us/work/shop/cty/pdp/spd/precision-t5500

Windows 7 Professional (32-Bit OS). Built for environments where space is at a premium, the Dell Precision T5500 delivers dual-socket workstation performance in a compact, quiet package. Incredibly fast and efficient despite its size, the Dell Precision T5500 features dual-socket Inte Xeon architecture with Intel QuickPath technology (in which each processor core features an integrated memory controller and high-speed interconnects), as well as support for up to 72GB* of DDR3 Registered ECC memory. For even more stunning levels of performance, the optional NVIDIA Tesla C2075 GPU card can be added, creating your own “personal supercomputer� for CUDA-enabled applications.

Proper citation: Dell T5500 Workstation (RRID:SCR_019833) Copy   

•   Source: SciCrunch Registry

https://www.dentonvacuum.com/products-technologies/thermal-evaporation/dv-502/

Thermal Evaporation system evaporates many of the metals and compounds involved in optical coatings, metallization, and electron microscope specimen preparation with no discernible contamination. This thin film deposition system also offers flexibility with a range of configurations available to meet your needs, including evaporation from a range of sources such as tungsten filaments, wire baskets, foil boats, baffle box heaters as well as carbon rod or yarn accessories., THIS RESOURCE IS NO LONGER IN SERVICE. Documented on September 16,2025.

Proper citation: Denton DV-502 Vacuum Evaporator (RRID:SCR_019835) Copy   

•   Source: SciCrunch Registry

https://www.dell.com/downloads/global/products/precn/Dell_Precision_T7500_Spec_Sheet_en.pdf

Our most workstation delivers the multi-core processing punch you,ve been waiting for with levels of performance you,ve only dreamed about. Developed in close collaboration with hardware and software partners, the nextgeneration Dell Precision T7500 workstation helps you create, design, render and analyze without compromise. Designed to deliver groundbreaking performance, blistering speed and scalability for compute and graphics-intensive environments, the Dell Precision T7500 helps you power through the most complex tasks and complete projects even faster with up to 50% more system memory than its predecessor.

Proper citation: Dell T7500 Workstation Computer (RRID:SCR_019836) Copy   

•   Source: SciCrunch Registry

https://www.dell.com/en-us/shop/servers-storage-and-networking/poweredge-r740-rack-server/spd/poweredge-r740/pe_r740_tm_vi_vp_sb

Server delivers outstanding functionality in just 2U of rack space. With the combination of processors, large memory, fast storage options and GPU accelerator support, the R730 performs exceptionally well in a number of demanding environments.

Proper citation: Dell PowerEdge R730 Rack Server (RRID:SCR_019831) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/tem/themis-etem-for-materials-science/

Environmental transmission electron microscope that is used for in situ observation of structure dynamics at nanostructure-characteristic length scales.

Proper citation: FEI Themis ETEM (Titan Environmental Transmission Electron Microscope) (RRID:SCR_019918) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/sem/Verios-G4-XHR-SEM-for-Materials-Science/

Microscope that is used for characterization of nanomaterials with sub nanometer resolution and high material contrast SEM.

Proper citation: FEI Verios 5 XHR SEM (RRID:SCR_019914) Copy   

•   Source: SciCrunch Registry

https://fluidigm.my.salesforce.com/sfc/p/#700000009DAw/a/4u0000019fxF/vgeiyRxF5ALVMw6cEJMViYvbiOqVT45BTHHN5.9fYK8

Mass cytometer that enables deep profiling of translational and clinical research samples across range of cell surface and intracellular markers. Helios represents newer, more advanced iteration with improvements in throughput, detection range, and software capabilities.

Proper citation: Fluidigm CyTOF Helios Mass Cytometer (RRID:SCR_019916) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/efa/meridian-v-for-semiconductors/

Electrical failure analysis system for semiconductors with optimized dynamic LSM platform that supports automated test equipment docking and back side analysis with laser voltage probing, laser voltage imaging, and laser simulation for critical path analysis.

Proper citation: FEI Meridian V System for Semiconductors (RRID:SCR_019889) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/sem/phenom-prox/

Desktop scanning electron microscope that offers fast, high-resolution imaging in addition to an integrated energy-dispersive X-ray diffraction (EDS) detector for elemental analysis.

Proper citation: FEI Phenom ProX SEM (RRID:SCR_019898) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/efa/meridian-iv-for-semiconductors/

Electrical failure analysis system for low-voltage, high-density semiconductor devices with the ability to diagnose wide ranging failure modes, including parametric failures and those resulting from design-process marginalities.

Proper citation: FEI Meridian IV System for Semiconductors (RRID:SCR_019892) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/tem/metrios-for-semiconductors/

Transmission electron microscope that provides fast, precise measurements for semiconductor manufacturers to develop and control their wafer fabrication processes.

Proper citation: FEI Metrios TEM for Semiconductors (RRID:SCR_019893) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/efa/nprober-iii-for-semiconductors/

Electrical failure analysis system for semiconductors with fault localization and transistor characterization that allows users to characterize individual transistor performance down to 7nm node.

Proper citation: FEI nProber III System for Semiconductors (RRID:SCR_019894) Copy   

•   Source: SciCrunch Registry

https://online-shop.eppendorf.us/US-en/Centrifugation-44533/Centrifuges-44534/Centrifuge-5804-5804R-PF-240993.html

Centrifuge 5804/5804 R is a high speed centrifuge for medium capacity needs. It allows for molecular applications in tubes up to 250 mL and offers additional swing,bucket and fixed,angle rotors as well as deepwell plate capacity for increased versatility. Eppendorf Centrifuge 5804/5804 R with its renowned quality and reliability offers you the most cost efficient solution for your medium throughput applications,now and in the future. It allows for molecular applications in tubes up to 250 mL and offers additional swing-bucket and fixed-angle rotors as well as deepwell plate capacity for increased versatility.

Proper citation: Eppendorf 5804 Centrifuge (RRID:SCR_019866) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/sem/phenom-xl/

Desktop scanning electron microscope with increased chamber size for large samples up to 100 mm x 100 mm.

Proper citation: FEI Phenom XL SEM (RRID:SCR_019900) Copy   

•   Source: SciCrunch Registry