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Resource Name
RRID:SCR_020019 RRID Copied      
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Hitachi S4700 Field Emission Scanning Electron Microscope (RRID:SCR_020019)
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Resource Information

URL: https://www.amnh.org/research/microscopy-and-imaging-facility/instruments/hitachi-s-4699

Proper Citation: Hitachi S4700 Field Emission Scanning Electron Microscope (RRID:SCR_020019)

Description: Hitachi S-4700 is a field emission scanning electron microscope (FE-SEM). More than a standard SEM, the S-4700, under optimal conditions, can magnify images upwards of 500,000 times and resolve features to 2 nanometers. In addition, a cathodoluminescence detector, backscatter electron detector and energy dispersive x-ray spectrographic detector accompany the microscope., THIS RESOURCE IS NO LONGER IN SERVICE. Documented on September 16,2025.

Resource Type: instrument resource

Keywords: Hitachi, Field Emission Scanning Electron Microscope, Instrument Equipment, USEDit

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