Searching the RRID Resource Information Network
Are you sure you want to leave this community? Leaving the community will revoke any permissions you have been granted in this community.
URL: https://www.fei.com/products/sem/phenom-xl/
Proper Citation: FEI Phenom XL SEM (RRID:SCR_019900)
Description: Desktop scanning electron microscope with increased chamber size for large samples up to 100 mm x 100 mm.
Resource Type: instrument resource
Keywords: FEI, SEM, Instrument Equipment, USEDit,
Expand AllWe found {{ ctrl2.mentions.all_count }} mentions in open access literature.
We have not found any literature mentions for this resource.
We are searching literature mentions for this resource.
Most recent articles:
{{ mention._source.dc.creators[0].familyName }} {{ mention._source.dc.creators[0].initials }}, et al. ({{ mention._source.dc.publicationYear }}) {{ mention._source.dc.title }} {{ mention._source.dc.publishers[0].name }}, {{ mention._source.dc.publishers[0].volume }}({{ mention._source.dc.publishers[0].issue }}), {{ mention._source.dc.publishers[0].pagination }}. (PMID:{{ mention._id.replace('PMID:', '') }})
Check
for all resource mentions.
A list of researchers who have used the resource and an author search tool
A list of researchers who have used the resource and an author search tool. This is available for resources that have literature mentions.
No rating or validation information has been found for FEI Phenom XL SEM.
No alerts have been found for FEI Phenom XL SEM.
Source: SciCrunch Registry
