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URL: https://www.fei.com/products/dualbeam/exsolve/
Proper Citation: FEI ExSolve Wafer TEM Prep DualBeam (RRID:SCR_019882)
Description: Sample preparation workflow that is used for transmission electron microscopy (TEM) analysis.
Resource Type: instrument resource
Keywords: FEI, sample preparation system, Instrument, Equipment, USEDit,
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