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URL: https://uwaterloo.ca/giga-to-nanoelectronics-centre/hitachi-s-3000n-scanning-electron-microscope
Proper Citation: Hitachi S3000N Scanning Electron Microscope (RRID:SCR_020029)
Description: Hitachi S-3000N scanning electron microscope (SEM) is a PC controlled variable pressure SEM with the ability to switch between the high vacuum and variable pressure modes. It has a high density frame memory of 1280x960 pixels and an advanced image capture and archiving system. Four quadrant solid state backscatter allows imaging in the compositional, 3D and topographic modes by manipulating from each segment of the detector.
Resource Type: instrument resource
Keywords: Hitachi, Scanning Electron Microscope, Instrument Equipment, USEDit
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