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Jeol Soft X-Ray Emission Spectormeter Scanning Electron Microscope (SEM) (RRID:SCR_020196)Copy Citation Copied
URL: https://www.jeolusa.com/PRODUCTS/Scanning-Electron-Microscopes-SEM/Soft-X-ray-Emission-Spectrometer
Proper Citation: Jeol Soft X-Ray Emission Spectormeter Scanning Electron Microscope (SEM) (RRID:SCR_020196)
Description: Scanning electron microscope that provides excellent light element detection and superb sensitivity that is best for chemial shift analysis of light elements
Resource Type: instrument resource
Keywords: Jeol, JEOL, Scanning Electron Microscope, Instrument Equipment, USEDit,
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