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URL: https://www.fei.com/products/tem/metrios-for-semiconductors/
Proper Citation: FEI Metrios TEM for Semiconductors (RRID:SCR_019893)
Description: Transmission electron microscope that provides fast, precise measurements for semiconductor manufacturers to develop and control their wafer fabrication processes.
Resource Type: instrument resource
Keywords: FEI, TEM, Instrument Equipment, USEDit,
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