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URL: https://industry.nikon.com/en-us/products/x-ray-ct/xt-h-225-xt-h-320/
Proper Citation: Nikon XT H 225 ST uCT system (RRID:SCR_023687)
Description: Provides insight into the inside of components and specimens, allowing users to visualize, analyze and measure complex internal geometry as well as surfaces, all non-destructively. Versatile microfocus CT system for high resolution inspection in R&D and failure analysis of components ranging from tiny plastic connectors up to aluminum castings.
Synonyms: Nikon XTH 225 ST microfocus Computer Tomography system
Resource Type: instrument resource
Keywords: USEDit, instrument, equipment, microfocus CT system, high resolution components inspection, components inspection,
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